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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-79019
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.7901
Zusammenfassung
We have applied magnetic force microscopy (MFM) with an in situ electromagnet to study the switching of the magnetization of submicrometer Co dots fabricated by means of electron-beam lithography. By using the MFM tip as a local-field source, the magnetization of individual single-domain Co dots could be reversed. Micromagnetic simulations show that the switching process is induced by ...
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