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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-252730
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25273
Alternative Links zum Volltext:DOI
Zusammenfassung
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with ...
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