Multi-lens array full-field X-ray microscopy

Please always quote using this URN: urn:nbn:de:bvb:20-opus-244974
  • X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in termsX-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga K\(_α\)-line and compared to a ray-tracing simulation of the setup.show moreshow less

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Metadaten
Author: Alexander Opolka, Dominik Müller, Christian Fella, Andreas Balles, Jürgen Mohr, Arndt Last
URN:urn:nbn:de:bvb:20-opus-244974
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Language:English
Parent Title (English):Applied Sciences
ISSN:2076-3417
Year of Completion:2021
Volume:11
Issue:16
Article Number:7234
Source:Applied Sciences (2021) 11:16, 7234. https://doi.org/10.3390/app11167234
DOI:https://doi.org/10.3390/app11167234
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Tag:CRLs; X-ray microscopy; compound refractive X-ray lenses; full-field microscopy
Release Date:2023/05/24
Date of first Publication:2021/08/05
Licence (German):License LogoCC BY: Creative-Commons-Lizenz: Namensnennung 4.0 International