New Methods for Improving Embedded Memory Manufacturing Tests
- Due to the need for fast and energy-efficient accesses to growing amounts of data, the share and number of embedded memories inside modern microchips has been continuously increasing within the last years. Since embedded memories have the highest integration density of a fabrication technology they pose special test challenges due to complex manufacturing defects as well as strong transistor aging phenomena. This necessitates efficient methods for detecting more subtle defects while keeping test costs low. This work presents novel methods and techniques for improving the efficiency of embedded memory manufacturing tests. The proposed methods are demonstrated in an industrial setting based on production-proven transistor, memory as well as chip models and their benefits over the current state-of-the art is worked out.
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| Author: | Josef Kinseher |
|---|---|
| URN: | urn:nbn:de:bvb:739-opus4-6017 |
| Advisor: | Ilia Polian |
| Document Type: | Doctoral Thesis |
| Language: | English |
| Year of Completion: | 2018 |
| Date of Publication (online): | 2019/01/09 |
| Date of first Publication: | 2019/01/09 |
| Publishing Institution: | Universität Passau |
| Granting Institution: | Universität Passau, Fakultät für Informatik und Mathematik |
| Date of final exam: | 2018/09/05 |
| Release Date: | 2019/01/09 |
| GND Keyword: | Speicher <Informatik>GND; ChipGND; Eingebettetes SystemGND |
| Page Number: | 119 Seiten |
| Institutes: | Fakultät für Informatik und Mathematik |
| Dewey Decimal Classification: | 0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 000 Informatik, Informationswissenschaft, allgemeine Werke |
| open_access (DINI-Set): | open_access |
| Licence (German): |  Standardbedingung laut Einverständniserklärung |
