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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-406435
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.40643
Zusammenfassung
One mode of atomic force microscopy (AFM) is frequency-modulation AFM, in which the tip is driven to oscillate at its resonance frequency which changes as the tip interacts with the surface. Frequency-modulation lateral force microscopy (FM-LFM) is the variant of this technique in which the tip is oscillated along the surface. For an isolated adsorbate on a flat surface, the only signal in FM-LFM ...
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