@inproceedings{Hao2010-01-17Visua-6310,
  year={2010},
  doi={10.1117/12.840142},
  title={Visual Analytics of Large Multi-Dimensional Data Using Variable Binned Scatter Plots},
  number={7530},
  publisher={SPIE},
  series={SPIE Proceedings},
  booktitle={Visualization and Data Analysis 2010},
  editor={Park, Jinah and Hao, Ming C. and Wong, Pak C. and Chen, Chaomei},
  author={Hao, Ming C. and Dayal, Umeshwar and Sharma, Ratnesh K. and Keim, Daniel A. and Janetzko, Halldor},
  note={Article Number: 06}
}

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    <dcterms:abstract xml:lang="eng">The scatter plot is a well-known method of visualizing pairs of two-dimensional continuous variables. Multidimensional data can be depicted in a scatter plot matrix. They are intuitive and easy-to-use, but often have a high degree of overlap which may occlude a significant portion of data. In this paper, we propose variable binned scatter plots to allow the visualization of large amounts of data without overlapping. The basic idea is to use a non-uniform (variable) binning of the x and y dimensions and plots all the data points that fall within each bin into corresponding squares. Further, we map a third attribute to color for visualizing clusters. Analysts are able to interact with individual data points for record level information. We have applied these techniques to solve real-world problems on credit card fraud and data center energy consumption to visualize their data distribution and cause-effect among multiple attributes. A comparison of our methods with two recent well-known variants of scatter plots is included.</dcterms:abstract>
    <dc:creator>Janetzko, Halldor</dc:creator>
    <dc:creator>Dayal, Umeshwar</dc:creator>
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    <dc:creator>Keim, Daniel A.</dc:creator>
    <dc:contributor>Hao, Ming C.</dc:contributor>
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    <dcterms:title>Visual Analytics of Large Multi-Dimensional Data Using Variable Binned Scatter Plots</dcterms:title>
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    <dc:contributor>Sharma, Ratnesh K.</dc:contributor>
    <dc:contributor>Dayal, Umeshwar</dc:contributor>
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    <dcterms:bibliographicCitation>Also publ. in: Visualization and data analysis 2010 : 18 - 19 January 2010, San Jose, California, United States ; proceedings IS&amp;T/SPIE electronic imaging, science and technology / Jinah Park ... (Ed.). - Bellingham, Wash. : SPIE [u.a.], 2010. - Artikel 06. - ISBN 978-0-8194-7923-5</dcterms:bibliographicCitation>
    <dc:contributor>Janetzko, Halldor</dc:contributor>
    <dc:creator>Sharma, Ratnesh K.</dc:creator>
    <dc:creator>Hao, Ming C.</dc:creator>
    <dc:contributor>Keim, Daniel A.</dc:contributor>
    <dc:rights>terms-of-use</dc:rights>
    <dcterms:issued>2010-01-17</dcterms:issued>
    <dc:language>eng</dc:language>
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