- AutorIn
- Katrin Philipp Laboratory for Measurement and Sensor System Techniques, Technische Universität Dresden
- André SmolarskiLaboratory for Measurement and Sensor System Techniques, Technische Universität Dresden
- Andreas FischerLaboratory for Measurement and Sensor System Techniques, Technische Universität Dresden
- Nektarios Koukourakis
- Moritz Stürmer
- Ulricke Wallrabe
- Jürgen Czarske
- Titel
- High-contrast 3D image acquisition using HiLo microscopy with an electrically tunable lens
- Zitierfähige Url:
- https://nbn-resolving.org/urn:nbn:de:bsz:14-qucosa2-351031
- Konferenz
- SPIE Photonics Europe. Brussels, 3.-7. April 2016
- Quellenangabe
- Optical Micro- and Nanometrology VI
Herausgeber: Christophe Gorecki, Anand Krishna Asundi, Wolfgang Osten
Erscheinungsort: Bellingham, Wash.
Verlag: SPIE
Erscheinungsjahr: 2016
Titel Schriftenreihe: Proceedings of SPIE
Bandnummer Schriftenreihe: 9890 - Erstveröffentlichung
- 2016
- Abstract (EN)
- We present a HiLo microscope with an electrically tunable lens for high-contrast three-dimensional image acquisition. HiLo microscopy combines widefield and speckled illumination images to create optically sectioned images. Additionally, the depth-of-field is not fixed, but can be adjusted between widefield and confocal-like axial resolution. We incorporate an electrically tunable lens in the HiLo microscope for axial scanning, to obtain three-dimensional data without the need of moving neither the sample nor the objective. The used adaptive lens consists of a transparent polydimethylsiloxane (PDMS) membrane into which an annular piezo bending actuator is embedded. A transparent fluid is filled between the membrane and the glass substrate. When actuated, the piezo generates a pressure in the lens which deflects the membrane and thus changes the refractive power. This technique enables a large tuning range of the refractive power between 1/f = (-24 . . . 25) 1/m. As the NA of the adaptive lens is only about 0.05, a fixed high-NA lens is included in the setup to provide high resolution. In this contribution, the scan properties and capabilities of the tunable lens in the HiLo microscope are analyzed. Eventually, exemplary measurements are presented and discussed.
- Andere Ausgabe
- Link zum Artikel, der zuerst in der Zeitschrift 'Proceedings of SPIE' erschienen ist.
DOI: 10.1117/12.2225596 - Freie Schlagwörter (DE)
- Elektrisch abstimmbare Linse, Speckle, Fluoreszenzmikroskopie, HiLo-Mikroskopie
- Freie Schlagwörter (EN)
- Electrically tunable lens, Speckle, Fluorescence Microscopy, HiLo Microscopy
- Klassifikation (DDC)
- 620
- Verlag
- SPIE, Bellingham, Wash.
- Förder- / Projektangaben
- Deutsche Forschungsgemeinschaft
ID: Cz55-32 - Version / Begutachtungsstatus
- publizierte Version / Verlagsversion
- URN Qucosa
- urn:nbn:de:bsz:14-qucosa2-351031
- Veröffentlichungsdatum Qucosa
- 30.08.2019
- Dokumenttyp
- Konferenzbeitrag
- Sprache des Dokumentes
- Englisch
- Lizenz / Rechtehinweis