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Valence determination of rare earth elements in lanthanide silicates by L 3-XANES spectroscopy

Kravtsova, A. N.; Guda, A. A.; Goettlicher, J. 1; Soldatov, A. V.; Taroev, V. K.; Kashaev, A. A.; Suvorova, L. F.; Tauson, V. L.
1 ANKA - die Synchrotronstrahlungsquelle am KIT (ANKA), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Lanthanide silicates have been hydrothermally synthesized using Cu and Ni containers. Chemical formulae of the synthesized compounds correspond to K3Eu[Si6O15] 2H2O, HK6Eu[Si10O25], K7Sm3[Si12O32], K2Sm[AlSi4O12] 0.375H2O, K4Yb2[Si8O21], K4Ce2[Al2Si8O24]. The oxidation state of lanthanides (Eu, Ce, Tb, Sm, Yb) in these silicates has been determined using XANES spectroscopy at the Eu, Ce, Tb, Sm, Yb, L 3- edges. The experimental XANES spectra were recorded using the synchrotron radiation source ANKA (Karlsruhe Institute of Technology) and the X-ray laboratory spectrometer Rigaku R- XAS. By comparing the absorption edge energies and white line intensities of the silicates with the ones of reference spectra the oxidation state of lanthanides Eu, Ce, Tb, Sm, Yb has been found to be equal to +3 in all investigated silicates except of the Ce-containing silicate from the run in Cu container where the cerium oxidation state ranges from +3 (Ce in silicate apatite and in a KCe silicate with Si12O32 layers) to +4 (starting CeO2 or oxidized Ce2O3).


Volltext §
DOI: 10.5445/IR/1000059590
Originalveröffentlichung
DOI: 10.1088/1742-6596/712/1/012096
Scopus
Zitationen: 13
Dimensions
Zitationen: 11
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2016
Sprache Englisch
Identifikator ISSN: 1742-6588
urn:nbn:de:swb:90-595906
KITopen-ID: 1000059590
HGF-Programm 56.98.01 (POF III, LK 01) Betrieb in MML
Erschienen in Journal of physics / Conference Series
Verlag Institute of Physics Publishing Ltd (IOP Publishing Ltd)
Band 712
Heft 1
Seiten 012096
Bemerkung zur Veröffentlichung 16th International Conference on X-ray Absorption Fine Structure (XAFS16), Karlsruhe, August 23-28, 2015
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