Home > Publications database > Characterization of the cell-substrate interface using surface plasmon resonance microscopy |
Book/Dissertation / PhD Thesis | FZJ-2018-07450 |
2018
Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag
Jülich
ISBN: 978-3-95806-369-3
Please use a persistent id in citations: http://hdl.handle.net/2128/20963 urn:nbn:de:0001-2019030702
Abstract: In this thesis an improved surface plasmon resonance microscopy (SPRM) setup has been developed which combines a projector based SPRM widefield mode with several SPRM scanning modes for the investigation of the cell-substrate interface. Widefield SPRM can be used to image the cell-substrate adhesion areas qualitatively. Here, the resolution is strongly dependent on the light source. While coherent laser light gives rise to speckle noise, which frustrates the resolution of small cellular structures such as neuronal dendrites, using a projector as an incoherent light source allows for a high resolution imaging. Scanning SPRM can be used to determine the cell-substrate distance quantitatively. So far, the accuracy of these measurements was compromised by the assumption of a homogeneous refractive index (RI). In this thesis, it is shown that the RI can be extracted from the SPRM signal at each scanning point at the cell-substrate interface which allowed for an improvement of the distance accuracy by a factor of 25 compared to the standard analysis technique realizing a distance accuracy of up to 1.5 nm. The measurements of RI and distance were validated by several reference measurements. The RI of the cell gives interesting insights into the cellular structure and cellular processes. Scanning the cell-substrate interface, it could be shown that the RI profile of a cell can reveal the position of cell organelles and give quantitative values for their refractive indices while the scanning SPRM also allows for the reconstruction of the 3D structure of the basal cell membrane. [...]
The record appears in these collections: |